P2 Publisher Scenario Presets
ARSVIN P2 adds a publisher-side Scenario Preset workflow for the existing State Sequencer workspace.
This is intentionally not an analyzer and not a certified transient simulator. It is a fast way to generate repeatable Sampled Values output patterns from the publisher for lab checks, relay behavior trials, classroom demos, and offline evidence generation.
UI workflow
- Open ARSVIN.
- Select or import an SCL stream.
- Open the Sequence workspace.
- Choose a scenario from the new scenario preset drop-down.
- Click Scenario.
- Review or edit the generated state cards.
- Run dry/live publish, export PCAP, or export publisher evidence report.
Included presets
| Preset | Purpose | Notes |
|---|---|---|
| Protection fault | Prefault / fault / recovery | Balanced 3-phase protection scenario. |
| CT saturation stress | High-current stress approximation | Does not model clipped CT waveform distortion. |
| VT fuse / undervoltage | 3-phase undervoltage approximation | Current State Sequencer does not model per-phase voltage collapse yet. |
| Frequency steps | 49 to 51 Hz | Discrete steps, not a continuous frequency ramp. |
| Phase jump | ±20 degrees | Balanced phasor phase-jump scenario. |
| Load reversal | 180 degree shift | Directional element lab approximation. |
Safety boundary
The presets are publisher-side state patterns. They do not prove that a subscriber received the stream, and they do not replace a calibrated relay test set, conformance test, or IEC/IEEE 61850-9-3 synchronized merging unit.
Why this belongs in ARSVIN publisher
A publisher should help the operator create credible output streams quickly. Scenario presets keep the product focused on publishing while avoiding analyzer scope creep.
P2 full update
This older P2 preset note is superseded by the full scenario engine documentation:
The full P2 engine adds per-phase multipliers, per-phase angle offsets, A-G/B-C fault presets, negative/zero-sequence presets, per-phase VT fuse fail, harmonic injection, DC offset transient, and CT saturation stress using publisher-side DC/harmonic/clipping approximations.